|The Flying Probe Tester FA1116-03 is a high-speed automatic board tester that uses|
newly developed low-impact probes and precision soft-landing control to
achieve 30% faster cycle times for gold plating and fine pattern testing
than legacy products.
Model No. (Order Code)
• Super-high-speed testing at up to 100 points/sec
|HIOKI ATE LINEUP [ The Power to Connect ]|
The power to connect that Hioki's printed circuit board testing systems deliver is the power to connect to the future. The ability to continue to support this rich and satisfying lifestyle together with customers is a small part of what testing systems can do.
|Infomation movie FA1116|
|Advantages of capacitance testing|
Capacitance testing is an essential test technique for reducing flying probe test times.
The greatest advantage of the vacuum-clamp method is that testing can be carried out without regard to the board shape or the number of layers.Products cannot be shipped unless they can be verified to be non-defective through testing.
Test times are determined by the number of test points and the speed setting, which reflects the extent of impact marks.
|Advantages of single-sided vacuum-clamp capacitance testing (discontinuity testing)|
Single-sided testing is characterized by the ability to conduct continuity testing with other nets.
|Stable impact marks and high-speed testing|
To the extent that electrical testing is performed, probe impact marks on the circuit board are inevitable.It goes without saying that a fixed set of conditions can be easily identified for the tester if the measurement target conforms to certain fixed conditions itself.
|Reduced-impact link probes (option)|
By combining newly designed reduced-impact probes and precision soft-landing control, the FA1116-03 makes it possible to approach the maximum speed setting during fine pattern testing.
Users can select from an extensive range of variations based on the types of boards they wish to test.
|Edit Gerber data with the FEB-LINE UA1781.|
In the UA1781 data creation system, Hioki developed its own software for editing Gerber data.
|Search for defective nets with the FAIL VISUALIZER UA1782.|
Viewer software that displays defective nets and searches for defect locations based on the results of capacitance measurement.
|Number of arms||2|
|Number of test steps||Max. 40,000 steps/piece|
|DC Measurement ranges||Resistance : 400 μΩ to 40 MΩ|
Capacitance : 4 μF to 40 mF
Diode, transistor (VF) : 0 to 25 V
Zener diode (VZ) : 0 to 25 V
Short :400 mΩ to 40 kΩ
Open :4 Ω to 4 MΩ
Voltage :0 to 25 V
|AC Measurement ranges||Resistance : 100 Ω to 100 MΩ|
Capacitance : 10 fF to 10 μF
Inductance : 10 μH to 100 mH
|Measurement time||Max. 100 points/s (X-Y movements of 0.1 mm, 2 arm simultaneous probing, capacitance measurement)|
|Probe working area||610 mm (24.02 in) W × 510 mm (20.08 in) D|
|Fixed board dimensions||Thickness : 0.1 mm to 3.2 mm (0.13 in)|
Outer dimensions : 50 mm (1.97 in) W × 50 mm (1.97 in) D to 610 mm (24.02 in) W × 510 mm (20.08 in) D
Upper surface - 10 mm (0.39 in) (including board thickness)
Lower surface - 0.1 mm (0.00 in)
|Power supply||200 V AC ±10% (single-phase), 50/60 Hz, 3 kVA|
|Dimensions and mass||1,443 mm (56.81 in) W × 1,656 mm (65.20 in) H × 1,185 mm (46.65 in) D, 1,000 kg (35,273.4 oz)|
|Catalog: FLYING PROBE TESTER FA1116||Download PDF [1MB]||English|
|Catalog: FEB-LINE INSPECTION DATA CREATION SYSTEM UA1781||Download PDF [1MB]||English|
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