As today’s information-centric society continues to evolve, smartphones and other mobile devices are operating at frequencies as high as several gigahertz in order to provide capabilities such as LTE, Wi-Fi, and GPS support. This trend in turn is driving up the frequencies of electronic components such as high-frequency inductors and ferrite beads that are used in those devices. The need to perform characteristics evaluations of these electronic components at high frequencies ranging from several hundred megahertz to several gigahertz is fueling demand for high-frequency measuring instruments.
The newly available IM7587 can make measurements at even higher frequencies than the IM7585, which was launched last year (maximum measurement frequency is 1.3 GHz).The IM7587’s measurement frequency ranges from 1 MHz to 3 GHz, enabling it to measure today’s increasingly high-frequency electronic components.
1. High-frequency measurement at up to 3 GHz
With a testing frequency of 1MHz to 3GHz, the Impedance Analyzer IM7587 can be used in a variety of applications.In particular, the instrument’s Analyzer Mode, which varies the frequency while making measurements, delivers minimal variability across a wide frequency range so as to ensure highly stable impedance evaluations, enabling it to meet applications in various fields from R&D to manufacturing.
2. Higher productivity thanks to high-stability, high-speed measurement in as little as 0.5 ms
The IM7587 can perform high-speed measurement in as little as 0.5 ms. For manufacturers of electronic components, who must test large quantities of components at high speeds, this capability translates into dramatically increased productivity.
3. Lower production costs thanks to a more compact footprint
The IM7587 features a compact footprint. This enables electronic component manufacturers who build rack-mounted testing systems for automatic testing on production lines to construct smaller testing systems that pack more instruments into available rack space. The result is shorter testing 2times and lower production costs.In addition, the IM7587 represents the lightest and most portable measuring instrument in its class, taking up minimal workspace and making it ideal across a wide variety of applications including R&D, quality assurance and manufacturing.
4. Extensive functionality for generating pass/fail judgments
In LCR meter mode, in which the instrument makes measurements at a single frequency, the IM7587 offers a comparator function for generating pass/fail judgments for electronic components as well as a binning function for sorting components. The comparator function generates pass/fail judgments using upper and lower limit values set by the user as criteria. Whereas the comparator function generates judgments based on a single set of criteria, the binning function ranks components basing on up to 10 sets of criteria.
In analyzer mode, in which the instrument makes measurements at multiple frequencies, the IM7587 offers area judgment and peak judgment functionality for generating pass/fail judgments based on the frequency characteristics of the electronic component under test. Area judgment is used to check whether measured values for target components fall within a user-defined judgment area, while peak judgment provides functionality for judging resonance points.
The instrument also offers a new capability in its spot judgment function, which generates pass/fail judgments based on multiple user-configured frequency settings.
5. Long-awaited Hioki fixture set
This July, Hiokialso launched the SMD Fixture IM9201, which is indispensable for research and development as well as quality control.The IM9201 can test increasingly high frequency electronic components up to 3GHz, which when paired with the IM7587, brings real power to the field of component testing.
* Basic Accuracy: Z: 0.65% rdg.; q: 0.38 (representative value)
* Measurement time: Min. 0.5 ms (analog measurement)
* Measurement range: 100 mΩ to 5 kΩ
* Measurement frequency: 1 MHz to 3 GHz
* Measurement signal level: -40.0 dBm to +1.0 dBm (4 mV to 502 mV)
* Shipping inspections and characteristics evaluations of electronic components
* Acceptance inspections and characteristics evaluations of electronic components
* Characteristics evaluations of electronic components at universities and research institutions