Data Analysis Software for Detecting Latent Defects on PASS Boards
Embed into Existing Equipment to Conduct Functional Tests of Individual Electronic Circuit Board Components or While Mounted on PCBs
Embed into Existing Equipment to Conduct Functional Tests of Individual Electronic Circuit Board Components or While Mounted on PCBs
Boost Productivity of Populated Circuit Board Testing with the Inline Automatic Testing System
Significantly lower testing costs while maintaining high-speed performance
Batch Testing System for Improved Populated Circuit
Board Productivity
Batch Testing System for Improved Populated Circuit
Board Productivity
High Performance Populated Board Testing with
Expansion Capabilities
Meeting Ever Increasing Demands for Greater Analytical Power,
Faster Testing Speeds and Reduced Costs
Complete Electrical Testing of High-Function Boards with a Single Unit
Electrical Testing Verifies Correct Mounting
Populated Board Testing System
Data Creation Software for Populated Board Testing
FLYING PROBE TEST 1/2 Data Generation Time With
New Platform
Robust Support for Repair Work Using Simple
Operations and Assistive Functionality
High-Precision Batch Fixture-Type Testing System that
Support Boards with Embedded Passive and Active
Devices
All-In-One Solution for Testing the Reliability of
Connections on Printed Circuit Boards
Data Creation Software for Populated Board Testing
Robust Support for Repair Work Using Simple
Operations and Assistive Functionality
FLYING PROBE TEST 1/2 Data Generation Time With
New Platform
High Performance Populated Board Testing with
Expansion Capabilities
Electrical Testing Verifies Correct Mounting
Populated Board Testing System
All-In-One Solution for Testing the Reliability of
Connections on Printed Circuit Boards
High-Precision Batch Fixture-Type Testing System that
Support Boards with Embedded Passive and Active
Devices
Robust Support for Repair Work Using Simple
Operations and Assistive Functionality
High-speed Testing at Up to 100 Points/sec. with Half
the Impact Mark Depth
FLYING PROBE TEST 1/2 Data Generation Time With New Platform
Complete Electrical Testing of High-Function Boards with a Single Unit
Meeting Ever Increasing Demands for Greater Analytical Power,
Faster Testing Speeds and Reduced Costs