1MHz to 3GHz Measurement Frequency Impedance
Analyzer with 0.5ms Test Speed and 0.07% Variability
|Hioki LCR Meters and Impedance Analyzers range from 1mHz to 3GHz devices|
to suit a wide range of applications in the testing of electronic
components. The IM7587 Impedance Analyzer offers a top measurement
time of 0.5ms over a 1MHz to 3GHz frequency range and superior
stability, making it ideal for R&D as well as high volume production
of ferrite chip beads and chip inductors.
Model No. (Order Code)
The instrument does not ship with a test fixture or probe.
• 1 MHz to 3 GHz testing source frequency
|IMPEDANCE ANALYZER IM7580 series：LCR Measurement Using the SMD Test Fixture IM9201|
The IM7580 series encompasses five models covering measurement frequencies of 1 MHz to 3 GHz. Used in combination with the Test Fixture IM9201, which can accommodate six SMD sizes, IM7580 series instruments allow you to measure specimens easily and reliably.
|IMPEDANCE ANALYZER IM7580 series：Comparator function|
A comparator function lets you check whether measured values fall within a user-defined judgment range. This functionality is ideal for use in generating PASS/FAIL judgments for specimens.
|IMPEDANCE ANALYZER IM7580 series：Contact check function|
The instruments’ contact check function lets you check contact between the specimen and measurement terminals to detect faulty contact or verify good contact.
|IMPEDANCE ANALYZER IM7580 series：How to connect the test head|
Connect the cable of the test head to the impedance analyzer.
Download the sample application and view the Communications Command User Manual.
|Accuracy calculation information|
Calculate accuracy by simply entering a numerical value.
|Measurement modes||LCR mode, Analyzer mode (sweeps with measurement frequency and measurement level), Continuous measurement mode|
|Measurement parameters||Z, Y, θ, Rs (ESR), Rp, X, G, B, Cs, Cp, Ls, Lp, D (tanδ), Q|
|Measurable range||100 mΩ to 5 kΩ|
|Display range||Z: 0.00 m to 9.99999 GΩ / Rs, Rp, X: ± (0.00 m to 9.99999 GΩ)|
Ls, Lp: ± (0.00000 n to 9.99999 GH) / Q: ± (0.00 to 9999.99)
θ: ± (0.000° to 180.000°), Cs, Cp: ± (0.00000 p to 9.99999 GF)
D: ± (0.00000 to 9.99999), Y: (0.000 n to 9.99999 GS)
G, B: ± (0.000 n to 9.99999 GS), Δ%: ± (0.000 % to 999.999 %)
|Basic accuracy||Z: ±0.65 % rdg. θ: ±0.38°|
|Measurement frequency||1 MHz to 3 GHz (100 kHz setting resolution)|
|Measurement signal level||Power: -40.0 dBm to +1.0 dBm|
Voltage: 4 mV to 502 mVrms
Current: 0.09 mA to 10.04 mArms
|Output impedance||50 Ω (at 10 MHz)|
|Display||8.4-inch color TFT with touch screen|
|Measurement speeds||FAST: 0.5 ms (Analog measurement time, typical value)|
|Functions||Contact check, Comparator, BIN measurement (classification), Panel loading/saving, Memory function, Equivalent circuit analysis, Correlation compensation|
|Interfaces||EXT I/O (Handler), USB communication, USB memory, LAN, RS-232C (optional), GP-IB (optional)|
|Power supply||100 to 240 V AC, 50/60 Hz, 70 VA max.|
|Dimensions and mass||Main unit: 215 mm (8.46 in) W × 200 mm (7.87 in) H × 348 mm (13.70 in) D, 8.0 kg (282.2 oz)|
Test head: 90 mm (3.54 in) W × 64 mm (2.52 in) H × 24 mm (0.94 in) D, 300 g (10.58 oz)
|Accessories||Test head ×1, Connection cable ×1, Instruction manual ×1, LCR application disc (Communications user manual) ×1, Power cord ×1|